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Fault-tolerance and reliability techniques for high-density random-access memories

By:

Chakraborty, Kanad

Contributor(s):

Mazumder, Pinaki

Material type: Text

Text

TextPublication details: PHI, New Delhi: ©2002Description: xix, 426pISBN:

9788120322141

Subject(s):

Computer Science Engineering

DDC classification:

KAN 621.3973

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Item type	Current library	Collection	Call number	Status	Date due	Barcode
Reference Books	GCET LIBRARY B.Tech (CSE)	Computer Science Engineering	MAZ (Browse shelf(Opens below))	Not for loan		039738

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Previous	MAK Writing compilers and interpreters: A software engineering	MAK Writing compilers and interpreters: A software engineering	MAT Cloud security and privacy: An enterprise perspective on risks and compliance	MAZ Fault-tolerance and reliability techniques for high-density random-access memories	MC Strange loyalties	MCC Hacking exposed: Network security secrets and solutions	MCC Hacking exposed 6: Network security secrets and solutions	Next

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