000 00402nam a2200157Ia 4500
003 OSt
008 181001s2003 xx 000 0 und d
020 _a9780070483392
082 _a620.00452
_bBAL
100 _aBalagurusamy, E.
245 0 _aReliability engineering
260 _bTata McGraw-Hill,
_aNew Delhi:
_c©2003
300 _axviii, 300p.
650 _aElectrical Engineering
942 _2ddc
_cBK
999 _c2218
_d2218