000 00487nam a2200169Ia 4500
003 OSt
008 181001s2018 xx 000 0 und d
020 _a9788120322141
082 _bKAN
_a621.3973
100 _aChakraborty, Kanad
245 0 _aFault-tolerance and reliability techniques for high-density random-access memories
260 _bPHI,
_aNew Delhi:
_c©2002
300 _axix, 426p.
650 _aComputer Science Engineering
700 _aMazumder, Pinaki
942 _2ddc
_cREF
999 _c4720
_d4720